X – Ray Diffraction Laser THERMO LOGG Contact Angle Analyzer Langmuir – Blodgett Film Deposition Scanning Electron Microscope with EDS (X-ray spectrometry) Small Angle X-Ray Scattering Apparatus Wide Angle X-Ray Scattering Apparatus Mercury Porosimeter Mass Spectrometer Nitrogen Porosimeter ultra-microtome AA GC-MS Scanning Electron Microscope with EDS (X-ray spectrometry) Proteome analysis [Proteomics] Remote Measurement System Transmission Electron Microscope CNC ΑGIECharmilles ΑCTSPARK FW-1P [CNC AGIE] CNC DMG CTX 510 Eco PHOTRON FASTACAM SA3 INSTRON 8801 Testing Device ROMER OMEGA R-SCAN & 3D RESHAPER LASER Cutter Pantograph with extra PLASMA torch CNC ΙDA XL 1200 Optical and Contact Coordinate Measuring Machine TESA MICRO-HITE 3D  RSV-150 Remote Sensing Vibrometer Ground Penetration Radar [GPR] Audio Magneto Telluric Optical Time Domain Reflectometers [OTDR] Non ion Rad Electric e-mat analysis Thermogravimetric Analyzers - Differential Scanning Calorimetry Magnetron Deposition Metal Deposition Grid Computing Center

Transmission Electron Microscope [TEM]

Transmission electron microscopy (TEM) is a powerful tool for examining materials at high resolution.In the microscope, electrons are directed through a series of lenses through a thin sample (<200 nm thick).TEM can provide microstructural details down to an atomic level and can be utilised to examine crystal structures and crystalline defects.       

Contact person:

John W. Nolan
tel. (+30) 2510462247
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The JEM-2100 is an advanced Field Emission Electron Microscope featuring ultrahigh resolution and rapid data acquisition. The JEM 2100 is a next generation TEM that simplifies atomic level structural analyses in biology, medicine, and materials sciences as well as the semiconductor and pharmaceutical industries.

 

Transmission electron microscopy (TEM) is a powerful tool for examining materials at high resolution. In the microscope, electrons are directed through a series of lenses through a thin sample (<200 nm thick). The transmitted electrons then pass through additional lenses to be projected onto a viewing screen or recorded with a digital camera. TEM can provide microstructural details down to an atomic level and can be utilised to examine crystal structures and crystalline defects.

 

The JEM-2100 has been developed to achieve the highest image quality and the highest analytical performance in the 200kV class analytical TEM with a probe size under 0.5nm. The new side-entry goniometer stage provides ease of use tilt, rotation, heating and cooling, programmable multi-point settings--all without mechanical drift. The JEM-2100 equipped with EDS and CCD-cameras.

 

TEM is one of the first non optical microscopes developed, initially to overcome the resolution limit of light microscopes. After development, it was discovered that electron microscopes have many addition benefits, including better depth of view. As the name suggests, in TEM, electrons transmit through a thin sample. As they pass through the sample, some of the electrons interact with the sample (atom based electrons) through elastic scattering, and are forward scattered towards a fluorescent screen (or suitable camera) where they are detected. This scattering by atoms in the specimen perturb the plain coherent wave of electrons impinging on the specimen and enables us to image features on the sample at high resolutions.

 

JEM 2100 TEM in our laboratory.



The JEM 2100 TEM is a high resolution (x300 - x1.5M) 200kV TEM, with electron diffraction, two Gatan cameras for digital image capture and an Oxford Instruments EDS system for elemental analysis. The system is complimented with a gatan TEM sample preparation system, including a precision ion polishing system.

 

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Precision Ion Polishing System in our sample-prep room. 

 

Relevant Links

TEM on Wikipedia
Electron Microscopy in Nanoscience
JEM 2100 TEM